ACTIVES, EEE Components, SPECIFICATIONS / QPLs

Review of main changes in generic specification MIL-PRF-55310 REV. F

Posted by José Francisco Largaespada
On July 19, 2019
0

Space standards (such as ESCC and MIL standards) have helped throughout the years to develop the industry and to achieve de mission goals. Standards improve the competitiveness, efficiency and knowledge transfer within space business. However, standards are not frozen documents, but rather they must change and adapt to the current requirements of the industry and the new developments and knowledge gathered during all the years of space missions.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

XPS, how it works and its applications in EEE parts

Posted by Francisco Javier Aparicio Rebollo
On May 30, 2019
0

X-ray photoemission spectroscopy (XPS) also known as electron spectroscopy for chemical analysis (ESCA) is a surface-sensitive quantitative analysis method to accurately determine the elemental composition of solid materials. The technique is the most extended tool for the chemical characterization of thin films coatings and surfaces either for industrial applications as well as for research

PHYSICAL, MECHANICAL & ASSEMBLY, TESTING

How can failures in vibration tests be avoided?

Posted by María Teresa Rodríguez
On May 16, 2019
0

As it has been mentioned in “Vibration Test on Hi-Rel for EEE Parts”, vibration tests are important to check the reliability of the components/assemblies. These tests can be a headache and suppose a great cost if the design of the device and the fixing tool are not properly done. Simulation tools are the key to anticipate to the problems reducing costs and lead times.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

XRF tool, how it works and its applications in EEE parts

Posted by Francisco Javier Aparicio Rebollo
On May 16, 2019
0

XRF is a non-destructive and quick analytical tool to determine the chemical elements present in the specimen. In particular, it combines low detection limit (particularly in the case of heavy elements) with quick and easy sample preparation.

ACTIVES, EEE Components

ASIC DESIGN SUPPORT CAPABILITIES

Posted by Sonia Vargas
On May 16, 2019
0

An ASIC is an application specific integrated circuit, which is usually designed to cover a need of functionality or performance (speed, power consumption, dimensions, etc.) that cannot be achieved by a combination of preexistent integrated circuits. The design of an ASIC implies the interoperability of complex tools. In the figure, it can be observed a simplified flow for a low power mixed-signal ASIC design, where both the digital and analog flow will converge via open access.

EEE Components, PASSIVES

MLCC cracking issues in low voltage is report & evaluates by NASA

Posted by Tomáš Zedníček
On May 15, 2019
0

Report prepared by Alexander Teverovsky, ASRC Federal Space and Defense. NASA recently released an extensive 70pages report on low voltage MLCC cracking issues published on nepp.nasa.gov. The report in detail describes the manufacturing process of MLCC types, provide comparative analyses of MIL, NASA vs ESA vs JAXA specifications, explains qualification procedures and cracking risk issues including degradation and failure mechanisms. The final section recommends methods for workmanship and failure detection.

INSPECTION, ELECTRICAL & VERIFICATION, TESTING

What is SEM EDS as Internal Material Analysis?

Posted by Francisco Javier Aparicio Rebollo
On May 2, 2019
0

This analytic technique may provide both qualitative and quantitative information of the composition of a surface, i.e. identification of the elements and the element weights, respectively. The technique relies on the detection and spectroscopy of secondary radiation (X-Ray) emitted when a high-intensity incident beam of electrons impinges upon the materials placed in its path. The SEM – EDS Internal Material Analysis (also known as EDX or EDAX) can be performed in accordance with MIL-STD-883, MIL-STD-750, MIL-STD-1580 and ESCC 25500 requirements.

ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Know all the characteristics of a HAST test?

Posted by Álvaro Ricca Soaje
On February 21, 2019
0

HAST test reduces the time it takes to complete the typical humidity 85 ºC / 85% RH testing for semiconductors (96 HAST hours are equivalent to 1000 THB hours). By elevating temperatures above 100°C (usually up to 130°C) and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms.

PHYSICAL, MECHANICAL & ASSEMBLY, TESTING

Test Methods in Electronic parts. The Vibration Tests

Posted by María Teresa Rodríguez
On February 13, 2019
2

The purpose of vibration tests is to evaluate the effect caused on component parts by vibration in a specified frequency range. The samples are subjected to testing under different conditions, as described below, in accordance with the respective applicable standards. The test conditions differ in terms of duration, frequency range, vibration waveform, amplitude, etc.

ALTER Laboratory Services, TESTING

Engineering and Testing of Hi Rel Electronic Components

Posted by David Ramirez - Cruzado
On July 3, 2010
0

The E.E.E. (Electrical, Electronic, and Electromechanical) components are the basic elements of any electronic system which are the fundamental building blocks that determine the final equipment performance, in terms of the electrical performance, mechanical strength, and ability to meet the environmental stresses they will encounter in service.

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Tag: SCREENING