Radiation effects on electronics include cumulative damage (TID, TNID) and transient failures (SEE), requiring irradiation testing.
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Radiation effects on electronics include cumulative damage (TID, TNID) and transient failures (SEE), requiring irradiation testing.
TID test standards define irradiation methods, dose rates, and handling to assess component tolerance to total ionizing dose.
Radiation affects EEE components in space through TID, displacement damage, and single event effects, impacting mission reliability.
Radiation analysis documents component tolerance to space radiation, ensuring compliance with mission-specific exposure levels.
Radiation environment analysis for space systems, including TID, TNID, and SEE evaluation on satellite components.
Explore expert answers on space radiation effects, simulation tools, and COTS testing from our recent technical webinar.