The Product/Process Change Notification (PCN) #19-001 informs about the changes in the deposition method of dielectric material, silicon dioxide, used as a protective glassivation layer over thin-film resistors
The reliability of the components used in a spacecraft is a determinating factor for their operation and performance throughout the mission life.
Only the most advanced techniques are able to provide the depth and accuracy in the inspections required by current state of the art microelectronics.
Leading passive components manufacturers will discuss hot products, application notes and latest technology during the 2nd Passive Components Networking Symposium on 11th September 2019 in Bucharest, Romania
These devices uniquely address the stringent requirements and new challenges presented by megatrend applications in automotive Advanced Driver Assistance Systems (ADAS), autonomous driving and in digitalization uses such as supercomputing, mobility services, connectivity and infotainment. T598 automotive grade polymer electrolytic devices combine multiple high-performance characteristics including high capacitance/voltage (CV) ratings, single-digit equivalent series resistance (ESR), class-leading ripple performance, and ultra-extended life to truly enable the development and deployment of exciting and revolutionary technologies.
Tests, inspections or combination thereof, imposed on 100% of parts to remove unsatisfactory items or those likely to exhibit early failures.
Using stress testing, defects are weeded out in a product where the root causes cannot be eliminated. Removing all the defective parts (infant mortality) brings the lot to the constant failure rate (working life) phase.
The screening does not increase the reliability of the components but removes those showing weakness or defects. Tests, inspections or combination thereof, imposed on 100% of parts to remove unsatisfactory items or those likely to exhibit early failures.
Life test is an electrical stress test that typically employs voltage and/or temperature to accelerate the appearance of wear-out reliability failures in a device. The objective of life testing is to evaluate whether failures caused by wear-out are likely to occur during the product lifetime and thus to estimate compliance of the device with the long-term reliability requirements
Is an electrical stress test that typically employs voltage and/or temperature to accelerate the appearance of latent reliability defects in a device. The objective of burn-in is to eliminate all potential failure likely to occur at the early phase of the product life time (also called Infant Mortality Failure). It can easily be observed in a typical reliability bath tub curve as shown below.