Characterization of the Image Sensors: EMVA 1288 standard

Posted by Pawel Adamiec
On July 26, 2021
0

Characterization of the Image Sensors according to the EMVA 1288 standard and beyond

We have developed an EMVA standard-compliant system for characterizing image sensors in a wide wavelength range and developed a low-cost camera to drive different types of IC Sensors. The camera consists of the main electronics and the remote socket to hold an IS, which makes it a flexible test board for temperature, vacuum, or radiation tests with image sensors for space or automotive applications.

EMVA1288 Standard: How was it implemented in the ALTER labs?

Almost 20 years ago, representatives of the European machine vision industry established the European Machine Vision Association (EMVA), which have issued an EMVA1288 Standard for Characterization of Image Sensors and Cameras. Our goal is not to introduce the standard here (however, we encourage the readers to learn more about it, but to show how it is implemented in the ALTER labs.

Optical setups
Test boards and electrical measurements
Examples of the results

The EMVA1288 standard lets us measure the crucial parameters of the image sensors and cameras, converting the physical model of the camera to the mathematical model, where the parameters are extracted.

Fill the form to know how the EMVA 1288 standard was implemented in the ALTER labs

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Pawel Adamiec

Engaged in the analysis and studies of new photonic technologies at Alter Technology

Pawel Adamiec received Ph.D. degree in physics from Warsaw University of Technology, Warsaw, Poland, in 2006. From 2000 to 2012 he was working at the High Pressure Research Centre, Polish Academy of Sciences, Warsaw, Poland; Ferdinand-Braun-Institut für Höchstfrequenztechnik, Berlin, Germany; University of Technology in Madrid, Spain. At that time, he was investigating the properties of the semiconductor lasers or other optoelectronic devices and he was also responsible for the design and development of semiconductor lasers. In 2014 he joined ALTER TECHNOLOGY, where he is engaged in the analysis and studies of new photonic technologies for the aerospace sector. He was awarded Intra-European Marie-Curie Fellowship in 2009 and Torres Quevedo Fellowship in 2015. He is an author or co-author of more than 60 peer-reviewed journal papers and conference contributions.

ResearchGate: https://www.researchgate.net/profile/Pawel_Adamiec

Characterization of the Image Sensors: EMVA 1288 standard

Characterization of the Image Sensors according to the EMVA 1288 standard and beyond

EMVA1288 Standard: How was it implemented in the ALTER labs?

Fill the form to know how the EMVA 1288 standard was implemented in the ALTER labs

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