This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices, and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Hosting ESREF 2019 in this rich environment is a great opportunity since reliability in these particular applications is a very hot topic with strong challenges such as zero ppm failure and harsh environments.
For this 30th edition, in addition to the core topics of the conference, we would like to involve the major actors of aeronautics, space and embedded systems industry to provide specific topics such as radiation hardening, very long-term reliability, high/low temperature challenges, obsolescence and counterfeit issues, wide bandgap power devices for the more electric aircraft and other embedded system applications. A special session for Nanosatellite reliability is proposed.