ALTER Technology is proud to present its latest advancements in radiation-hardened electronics at AMICSA 2025. Our paper, “Test System for the Experimental Evaluation of a Low-Power High-Performance Four-Channel ADC for Space Applications,” showcases a comprehensive test platform developed to evaluate a custom-designed, radiation-hardened analog-to-digital converter (ADC) for use in space missions.
A New Benchmark in Space-Ready ADCs
The QUAD-ADC is a 14-bit, 80 MSps, four-channel pipeline ADC designed for scientific instrumentation in radiation-prone environments, such as the European Space Agency’s LISA mission. It combines high-speed performance with ultra-low power consumption and is fully Radiation Hardened by Design (RHBD).
Innovative Test System Architecture
To validate the QUAD-ADC’s performance, ALTER developed a sophisticated test system integrating:
- A custom-designed test PCB with precision analog circuitry
- An FPGA-based data acquisition module (Kintex-7)
- Applicos ATX7006 ATE for high-precision signal generation
- Low-jitter clock distribution for synchronized measurements
- Custom software for automated control and data analysis
This setup enables accurate, repeatable evaluation of both static (INL, DNL) and dynamic (SNR, THD, ENOB, SFDR) parameters under nominal and radiation-stressed conditions.
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Radiation Testing: TID and SEE
The QUAD-ADC was subjected to rigorous radiation testing to evaluate the performance for radiation:
- Total Ionizing Dose (TID):
Up to 100KRads using Co-60 source, using 5ON+5OFF samples. Measurements showed no significant degradation of static and dynamic parameters, and analog and digital consumptions remained constant during TID exposure.
Note that the QUAD-ADC test PCB is equipped with a custom-made socket that is used to attach the converter to the PCB with minimal influence of the socket during measurements
- Single Event Effects (SEE):
Large part of the platform developed to measure the QUAD-ADC performance was used for this test thanks to its modular design. It includes the main QUAD-ADC PCB, the low jitter clock distribution system and the XEM7350 FPGA module.
Heavy-ion testing up to 62.5 MeV·cm²/mg demonstrated immunity to latch-ups (SELs) and functional interruptions (SEFIs). Only transient out-of-range conversions (ORCs) were observed above 46.1 MeV·cm²/mg.
SEE test system inside the radiation chamber: general view
SEE test system inside the radiation chamber: main PCB
Conclusion
ALTER Technology’s test platform not only validates the QUAD-ADC’s robustness in extreme environments but expand the ALTER Technology’s capabilities to perform TID and SEE campaigns over complex ADCs for future missions thanks to the flexible platformed developed. These results reinforce our commitment to advancing reliable, high-performance electronics for the most demanding space applications.
We would like to express our sincere gratitude to the collaborators who have contributed to the completion of these activities: ESA, UniNova and Max Planck Institute.
Authors: Luis Carranza González, Mari Ángeles Jalón Victori, Juan José Medina Del Barrio, (ALTER TÜV NORD)
