Extension
(the validity date of the certificate is extended, and the scope is not changed, which means no new components are included):
- Certificates 284F and 336C from Schurter Lucerne (Switzerland). These certificates list Thin Film SMD Fuses based on types MGA‐S and HCSF included in the detail specifications ESCC 4008/001 and ESCC 4008/002
Related Articles
Introduction to Norris-Landzberg equation for thermal cycling test definition
The Norris-Landzberg equation is that it is required by ECSS in many calculations. For example, ECSS-Q-ST-70-61 and several ESA Memos indicate that the use of this equation is mandatory in order to assess if the qualification perform of PBAs covers the environment of the mission. Similar methodologies are widely referenced in MIL and NASA standards
Pushing Boundaries: Cryogenic Testing Expertise for Space EEE Components at ALTER
ALTER Technology is pushing the limits of space reliability through advanced cryogenic testing of EEE components for ESA’s ARIEL mission. Using state-of-the-art helium cryostats reaching temperatures as low as 10K, ALTER qualifies critical components, from microswitches to operational amplifiers—to ensure flawless performance in extreme thermal environments.
Discover the ALTER EEE parts engineering and Product Assurance capabilities at your service
ALTER EEE and Product Assurance scenario: The team of Senior EEE parts and PA engineers at ALTER will guide and help your team to understand the key drivers for the selection of the most suitable parts for your design, based on the deep knowledge of space market as well as the main standards used in Europe (ECSS-Q-ST-60s), US (NASA GSFC, DLA MIL-PRFs and QPL/QMLs) and commercial market (AEC-Q, …).
