Among other types of failures, acoustic techniques are particularly suitable for the detection of those irregularities involving materials and density changes, including voids and porosity as well as cracks and delamination, in any kind of EEE component.
Therefore this NON-DESTRUCTIVE testing method is included in different EVALUATION, SCREENING and LOT VALIDATION flows for several family of EEE components, which can be found in doEEEt platform.
ALTER TECHNOLOGY has a huge experience on this testing method, with the perfect cocktail of cutting edge equipment and experienced technicians.
Scanning acoustic microscopy (SAM) also denominated acoustic micro imaging (AMI) and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection and failure analysis of microelectronic components and materials. In Alter Technology we have all the tools to help you in your design; with ONE-STOP-SHOP that means: find your components in doEEEt and test them in Alter Technology.
The working principle of the technique is based on the reflection that acoustic waves experience at the interface between different media and density irregularities. Thus, the approach makes use of focalized ultrasound (MHz to GHz) pulses to image material interfaces and boundaries as well as hidden physical damages, either generated during manufacturing or induced after environmental testing and prolonged normal operation.
As illustrated in the figure, the technique is routinely used for the nondestructive detection of internal flaws such as:
