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Heavy ion failure rate computation based on sensitive volume characterization in GaN

ACCEDE 2022, EEE Components, PASSIVES

Heavy ion failure rate computation based on sensitive volume characterization in GaN

Posted by doEEEt Media Group
On September 16, 2022
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TAGS: ACCEDE 2022 COTS Gallium Nitride (GaN) GAN TECHNOLOGY HEAVY IONS HEMT

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