Very Extreme temperature Testing Parts

Posted by doEEEt Media Group
On February 21, 2020
0

Full ESCC evaluation ID and HIF Sensitivity evaluation of SiC of Silicon capacitors including thermal characterization at > 200ºC. Very Extreme temperature Testing Parts Reliability testing Endurance test Gamma and Heavy ions tests

ALTER Innovation

Bakeout and very Extreme temperature Testing Facilities

Posted by doEEEt Media Group
On February 21, 2020
0

8 cryogenic chambers with a temperature range from -195ºC to +400ºC and ramps up to 40ºC/min. Dimensions up to 90x50x35cm.

ALTER Innovation

New test methodologies

Posted by doEEEt Media Group
On February 21, 2020
0

Specific test development including external motion vacuum feed-through with controlled displacement are included in New Test methodologies

ALTER Laboratory Services, INSPECTION, ELECTRICAL & VERIFICATION, TESTING

When and What to do in an Electrical Test

Posted by Sonia Vargas
On February 21, 2020
1

For passive devices testing, we have equipment which permits the characterization of the electrical behavior of resistors, capacitors, coils, etc., in a wide range of test conditions and in accordance with their applicable specifications: Measurement and testing of high power devices, Dielectric withstanding, voltage up to 12 KV Characterization on LCR devices up to 3 GHz

ALTER Innovation

Very Extreme temperature Testing Examples

Posted by doEEEt Media Group
On February 20, 2020
0

All-optical & electrical parameters of different families of electronic components (Electro-optical, ASIC, RF, Discrete components, passive parts, new materials, etc…) can be characterized to asses usability of parts under such environment.

ALTER Innovation

Reliability of Liquid Crystals in Space Photonics

Posted by doEEEt Media Group
On February 19, 2020
0

Passive liquid crystal (LC) devices are becoming an interesting alternative for the manufacturing of photonic devices in spatial applications. These devices feature a number of advantages in this environment, the lack of movable parts, and of exposed electronics being among the most outstanding ones.

EEE Components, RF & MW

Approaching the 5G mmWave Filter Challenge

Posted by doEEEt Media Group
On February 19, 2020
0

The timeline for delivering mainstream 5G communications is getting tighter, and determining the appropriate RF filtering for 20 GHz and above is a fundamental issue.

ALTER Innovation

SEE testing on GaAs test vehicles. Methodology, Results and Derating.

Posted by doEEEt Media Group
On February 19, 2020
0

Radiation sensitivity of GaAs components is not really well known, compare to other technologies. Traditional radiation harness policy consisted in a good derating in DC bias conditions to ensure operation inside a known or expected DC safe operating area (SOA).

ALTER Innovation

Experience on SEE testing EEE parts

Posted by doEEEt Media Group
On February 19, 2020
0

Many basic testers available which offer the capability to carry out a test in a rather short delay (a few weeks) at a relatively low cost. Capability to develop on-demand test setup for complex devices (μP High-frequency devices, RF fixtures etc…) higher cost driven by the test preparation effort.

ALTER Innovation, ENDURANCE, ENVIRONMENTAL & RADIATION, TESTING

Working on the developing of a European standard for DD testing

Posted by doEEEt Media Group
On February 19, 2020
0

Propose a DD test standard • Should be available by the end of the year after ESA and Components Technology Board (CTB)/Radiation Working group (RWG) comments • Goal of this presentation ⇒ Not a draft of the future guidelines, but: • Remind the physical processes responsible of the displacement damages • Remind the electrical effects • List the main parameters that should be taken into account

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Month: February 2020